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2-port Test Set, 100 Khz To 8.5 Ghz With Bias Tees
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High Stability Timebase
2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
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2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
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2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
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2-port Test Set, 100 kHz to 8.5 GHz with Bias Tees
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The E5071C-285 operates from 100 kHz to 8.5 GHz with built-in bias tees. This 2-port configuration is ideal for measuring active devices that require DC biasing during RF characterization, such as amplifiers, transistors, and other semiconductor components.
The built-in bias tees allow you to apply DC voltage or current to your device under test while simultaneously making RF measurements from 100 kHz to 8.5 GHz. This is essential for characterizing active components like amplifiers and transistors in their proper operating conditions without requiring external bias tees or complex test setups.
The E5071C-285 is equipped with Type-N female connectors on both test ports. These 50 ohm connectors provide excellent performance across the analyzer's full frequency range and are compatible with a wide range of RF test cables and adapters.
At 3 kHz IF bandwidth, the E5071C-285 achieves 98 dB dynamic range from 10 MHz to 6 GHz and 92 dB from 6 to 8.5 GHz. With the narrowest 10 Hz IF bandwidth, dynamic range increases to 123 dB (10 MHz to 6 GHz) and 117 dB (6 to 8.5 GHz), providing exceptional sensitivity for measuring high-attenuation devices.
The primary differences are the starting frequency and bias tee capability. The E5071C-285 starts at 100 kHz (versus 9 kHz for the 280) and includes built-in bias tees for DC biasing of active devices. Both models cover up to 8.5 GHz and share the same 2-port Type-N connector configuration, but the 285 is specifically designed for active device testing.
The E5071C-285 delivers a nominal output power of 0 dBm with a range from -55 to 10 dBm across most of its frequency span. Power level accuracy is ±0.650 dB at 0 dBm (50 MHz reference), and level linearity is ±0.75 dB over the -20 to 10 dBm range, providing precise stimulus control for both linear and nonlinear device measurements.
The E5071C-285 supports full 2-port calibration using mechanical calibration kits (such as the 85032F for Type-N) or electronic calibration modules (85092C for Type-N, 300 kHz to 9 GHz). Response, isolation, full 1-port, and full 2-port SOLT calibrations are all available to achieve the specified corrected system performance across the frequency range.
The E5071C-285 achieves a specified test port noise floor of -123 dBm/Hz from 10 MHz to 5 GHz (at 10 Hz IF bandwidth), with typical performance of -130 dBm/Hz in the same range. From 5 to 8.5 GHz, the noise floor ranges from -119 to -120 dBm/Hz specified, enabling low-noise measurements of sensitive devices and high-gain amplifiers.